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LT - SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL MEASUREMENT UNIT
EN - SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL MEASUREMENT UNIT

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Patent not validated

Bibliographic data
Indications of the International Patent Classification (IPC)
(51) INT.CL. G01C 25/00
H01Q 1/12
European patent
(11) Number of the document 2869027
(13) Kind of document T
(96) European patent application number 14191916.7
Date of filing the European patent application 2014-11-05
(97) Date of publication of the European application 2015-05-06
(45) Date of publication and mention of the grant of the patent 2018-02-14
(46) Date of publication of the claims translation
Priority applications
(30) Number Date Country code
201314071844 2013-11-05 US
Inventors
(72)
ORZECHOWSKI, Pawel, US
Grantee
(73) ThinKom Solutions, Inc., 20000 Mariner Avenue Suite 500, Torrance, CA 90503, US
Title
(54) SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL MEASUREMENT UNIT
  SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL MEASUREMENT UNIT