LT - SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
EN - SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
Legal status
Patent not validated
Bibliographic data
Indications of the International Patent Classification (IPC)
(51) |
INT.CL. |
G06F 11/32 |
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G05B 23/02 |
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G06F 11/34 |
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G06F 17/50 |
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European patent
(11) |
Number of the document |
2975525 |
(13) |
Kind of document |
T |
(96) |
European patent application number |
14765305.9 |
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Date of filing the European patent application |
2014-03-07 |
(97) |
Date of publication of the European application |
2016-01-20 |
(45) |
Date of publication and mention of the grant of the patent |
2018-10-10
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(46) |
Date of publication of the claims translation |
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PCT application
(86) |
Number |
PCT/JP2014/001289 |
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Date |
2014-03-07 |
PCT application publication
(87) |
Number |
WO 2014/141660 |
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Date |
2014-09-18 |
Priority applications
(30) |
Number |
Date |
Country code |
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2013050629 |
2013-03-13
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JP |
Inventors
(72) |
NATSUMEDA, Masanao, JP
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Grantee
(73) |
NEC Corporation,
7-1, Shiba 5-chome Minato-ku, Tokyo 108-8001,
JP
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Title
(54) |
SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD |
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SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD |