LT - SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
EN - SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
Legal status
Patent not validated
Bibliographic data
Indications of the International Patent Classification (IPC)
| (51) |
INT.CL. |
G06F 11/32 |
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G05B 23/02 |
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G06F 11/34 |
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G06F 17/50 |
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European patent
| (11) |
Number of the document |
2975525 |
| (13) |
Kind of document |
T |
| (96) |
European patent application number |
14765305.9 |
|
Date of filing the European patent application |
2014-03-07 |
| (97) |
Date of publication of the European application |
2016-01-20 |
| (45) |
Date of publication and mention of the grant of the patent |
2018-10-10
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| (46) |
Date of publication of the claims translation |
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PCT application
| (86) |
Number |
PCT/JP2014/001289 |
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Date |
2014-03-07 |
PCT application publication
| (87) |
Number |
WO 2014/141660 |
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Date |
2014-09-18 |
Priority applications
| (30) |
Number |
Date |
Country code |
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2013050629 |
2013-03-13
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JP |
Inventors
| (72) |
NATSUMEDA, Masanao, JP
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Grantee
| (73) |
NEC Corporation,
7-1, Shiba 5-chome Minato-ku, Tokyo 108-8001,
JP
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Title
| (54) |
SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD |
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SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD |