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Legal status
Patent not validated
| (51) | INT.CL. | G01B 9/02 | (2022.01) |
| G01M 11/0271 | (2013.01) | ||
| G01M 11/02 | (2006.01) | ||
| G01M 11/338 | (2013.01) | ||
| G01M 11/00 | (2006.01) | ||
| G01M 11/331 | (2013.01) | ||
| G01B 11/06 | (2006.01) | ||
| G01B 9/0209 | (2013.01) | ||
| G01B 9/02064 | (2013.01) | ||
| G01B 9/02024 | (2013.01) | ||
| G01B 11/06 | (2013.01) | ||
| G01B 9/02072 | (2013.04) |
| (11) | Number of the document | 3423782 |
| (13) | Kind of document | T |
| (96) | European patent application number | 15823404.7 |
| Date of filing the European patent application | 2015-11-30 | |
| (97) | Date of publication of the European application | 2019-01-09 |
| (45) | Date of publication and mention of the grant of the patent | 2022-01-26 |
| (46) | Date of publication of the claims translation |
| (86) | Number | PCT/PL2015/050065 |
| Date | 2015-11-30 |
| (87) | Number | WO 2017/048141 |
| Date | 2017-03-23 |
| (30) | Number | Date | Country code |
| 41406415 | 2015-09-18 | PL |
| (72) |
STEPIEN, Karol , PL
JÓZWIK, Michalina , PL
NAPIERALA, Marek , PL
ZIOLOWICZ, Anna , PL
SZOSTKIEWICZ, Lukasz , PL
MURAWSKI, Michal , PL
LIPINSKI, Stanislaw , PL
HOLDYNSKI, Zbigniew , PL
STANCZYK, Tomasz , PL
NASILOWSKI, Tomasz , PL
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| (73) |
Polskie Centrum Fotoniki i Swiatlowodów ,
ul. Stanislawa Dubois 6/3, 20-061 Lublin,
PL
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| (54) | DEVICE AND METHOD FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS |
| DEVICE AND METHOD FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS |