LT - CRYSTAL-PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL-PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL-PHASE QUANTITATIVE ANALYSIS PROGRAM
EN - CRYSTAL-PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL-PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL-PHASE QUANTITATIVE ANALYSIS PROGRAM
Legal status
Patent not validated
Bibliographic data
Indications of the International Patent Classification (IPC)
(51) |
INT.CL. |
G01N 23/2055 |
(2018.01) |
|
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G01N 23/2055 |
(2013.01) |
|
|
G01N 23/207 |
(2018.01) |
|
|
G01N2223/0566 |
(2013.01) |
|
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G01N2223/605 |
(2013.01) |
|
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G01N2223/62 |
(2013.01) |
European patent
(11) |
Number of the document |
3667304 |
(13) |
Kind of document |
T |
(96) |
European patent application number |
18844423.6 |
|
Date of filing the European patent application |
2018-05-18 |
(97) |
Date of publication of the European application |
2020-06-17 |
(45) |
Date of publication and mention of the grant of the patent |
2023-07-26
|
(46) |
Date of publication of the claims translation |
|
PCT application
(86) |
Number |
PCT/JP2018/019359 |
|
Date |
2018-05-18 |
PCT application publication
(87) |
Number |
WO 2019/031019 |
|
Date |
2019-02-14 |
Priority applications
(30) |
Number |
Date |
Country code |
|
2017154292 |
2017-08-09
|
JP |
Inventors
(72) |
TORAYA, Hideo , JP
MUROYAMA, Norihiro , JP
|
Grantee
(73) |
Rigaku Corporation ,
3-9-12, Matsubara-cho, Akishima-shi
Tokyo 196-8666,
JP
|
Title
(54) |
CRYSTAL-PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL-PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL-PHASE QUANTITATIVE ANALYSIS PROGRAM |
|
CRYSTAL-PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL-PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL-PHASE QUANTITATIVE ANALYSIS PROGRAM |