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LT - CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT
EN - CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT

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Patent not validated

Bibliographic data
Indications of the International Patent Classification (IPC)
(51) INT.CL. G01R 29/08 (2006.01)
H04B 17/0085 (2013.01)
H04B 17/26 (2015.01)
G06N 20/00 (2019.01)
G01R 29/0892 (2013.01)
G01R 31/3025 (2013.01)
European patent
(11) Number of the document 4049045
(13) Kind of document T
(96) European patent application number 20762016.2
Date of filing the European patent application 2020-08-17
(97) Date of publication of the European application 2022-08-31
(45) Date of publication and mention of the grant of the patent 2024-09-25
(46) Date of publication of the claims translation
PCT application
(86) Number PCT/US2020/046677
Date 2020-08-17
PCT application publication
(87) Number WO 2021/080670
Date 2021-04-29
Priority applications
(30) Number Date Country code
201916660325 2019-10-22 US
Inventors
(72)
VAHEY, Scott W. , US
RUSSELL, Aubrey J. , US
Grantee
(73) Raytheon Company , 870 Winter Street, Waltham, Massachusetts 02451-1449, US
Title
(54) CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT
  CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT