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LT - Plonasienių anizotropinių kevalų paviršiaus kreivumo matavimo prietaisas
EN - MEASURING ARRANGEMENT FOR MEASURING CURVATURE OF SURFACE OF THIN-WALLED ANISOTROPIC SHELL

Legal status

Patent lapsed (non-payment of fees)

Bibliographic data
Indications of the International Patent Classification (IPC)
(51) INT.CL.: (2006.01) G01B 5/20
G01B 13/00
Patent
(11) Number of the document 4057
(13) Kind of document B
(21) Application number 95-012
(22) Date of filing the application 1995-01-30
(41) Date of publication of the application 1996-08-26
(45) Date of publication of patent 1996-11-25
Applicant
(71) Kauno technologijos universitetas, K. Donelaičio g. 73, 3006 Kaunas, LT
Inventors
(72) Matas GUTAUSKAS, LT
Julius VALTAS, LT
Vilius MASIULIS, LT
Saulius BITINAS, LT
Grantee
(73) Kauno technologijos universitetas, K. Donelaičio g. 73, 3006 Kaunas, LT
Attorney or representative
(74)
Title
(54) MEASURING ARRANGEMENT FOR MEASURING CURVATURE OF SURFACE OF THIN-WALLED ANISOTROPIC SHELL
Last renewal fee
Payment date Validity (years) Amount
1996-12-16 3 43.00 LTL
Legal status
Patent lapsed (non-payment of fees)
Invalidation date 1998-01-30