Patent details

EN | LT

LT - PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE

EN - PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE

Legal status

Patent not validated

Bibliographic data

Indications of the International Patent Classification (IPC)
(51)	INT.CL.	G01N 21/64
		G02B 21/00

European patent
(11)	Number of the document	2631631
(13)	Kind of document	T
(96)	European patent application number	11843762.3
	Date of filing the European patent application	2011-11-14
(97)	Date of publication of the European application	2013-08-28
(45)	Date of publication and mention of the grant of the patent	2016-01-20
(46)	Date of publication of the claims translation

PCT application
(86)	Number	PCT/JP2011/076151
	Date	2011-11-14

PCT application publication
(87)	Number	WO 2012/070414
	Date	2012-05-31

Priority applications
(30)	Number	Date	Country code
	2010262267	2010-11-25	JP

Inventors
(72)	HANASHI, Takuya, JP TANABE, Tetsuya, JP YAMAGUCHI, Mitsushiro, JP

Grantee
(73)	Olympus Corporation, 43-2, Hatagaya 2-chome, Shibuya-ku Tokyo 151-0072, JP

Title
(54)	PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE
	PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE