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LT - A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
EN - A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS

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Bibliographic data
Indications of the International Patent Classification (IPC)
(51) INT.CL. G01N 23/223 (2006.01)
G01N 23/223 (2013.01)
H05K 1/02 (2006.01)
H05K 1/0269 (2013.01)
H05K 1/181 (2013.01)
H05K 1/03 (2006.01)
H05K2201/10159 (2013.01)
H05K 1/09 (2006.01)
H05K 1/038 (2013.01)
H05K 1/11 (2006.01)
H05K 1/18 (2006.01)
H05K 3/3452 (2013.01)
H05K 3/28 (2006.01)
H05K 1/092 (2013.01)
H05K 3/34 (2006.01)
H05K 1/095 (2013.01)
H05K 3/22 (2006.01)
H05K 3/287 (2013.01)
A61B 5/024 (2006.01)
H05K 1/115 (2013.01)
A61B 5/0255 (2006.01)
H05K2201/0959 (2013.01)
A61B 5/00 (2006.01)
H05K 1/0275 (2013.01)
H05K 3/225 (2013.01)
H05K2203/168 (2013.01)
H05K2203/166 (2013.01)
Y02P 70/50 (2015.11)
European patent
(11) Number of the document 3472599
(13) Kind of document T
(96) European patent application number 17778790.0
Date of filing the European patent application 2017-04-04
(97) Date of publication of the European application 2019-04-24
(45) Date of publication and mention of the grant of the patent 2022-06-01
(46) Date of publication of the claims translation
PCT application
(86) Number PCT/IL2017/050404
Date 2017-04-04
PCT application publication
(87) Number WO 2017/175219
Date 2017-10-12
Priority applications
(30) Number Date Country code
201662317859 P 2016-04-04 US
Inventors
(72)
GROF, Yair , IL
KISLEV, Tzemah , IL
YORAN, Nadav , IL
ALON, Haggai , IL
Grantee
(73) Soreq Nuclear Research Center , Nahal Soreq, 81800 Yavne, IL
Security Matters Ltd. , Kibbutz Ketura, 8884000 D.N. Hevel Eilot, IL
Title
(54) A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS
  A METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS