Patent details

EN | LT

LT - Puslaidininkinių medžiagų fotoelektrinių parametrų holografinis matavimo būdas ir įrenginys

EN - HOLOGRAPIHIC DEVICE AND METHOD FOR DETERMINATION OF PHOTOELECTRIC PARAMETERS OF A SEMICONDUCTOR

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Patent lapsed (non-payment of fees)

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Patent application specification | Search report | Patent specification (0.44 Mb)

Bibliographic data

Indications of the International Patent Classification (IPC)
(51)	INT.CL.: (2006.01)	G01N 21/17 G03H 1/00 G01R 31/26

Patent
(11)	Number of the document	5402
(13)	Kind of document	B
(21)	Application number	2005 020
(22)	Date of filing the application	2005-03-01
(41)	Date of publication of the application	2006-09-25
(45)	Date of publication of patent	2007-02-26

Applicant
(71)	Kęstutis JARAŠIŪNAS, Ežero g. 23, 14159 Antežeriai, Vilniaus r., LT Markas SŪDŽIUS, Saulėtekio al. 35-52, 10222 Vilnius, LT

Inventors
(72)	Kęstutis JARAŠIŪNAS, LT Markas SŪDŽIUS, LT

Grantee
(73)	Kęstutis JARAŠIŪNAS, Ežero g. 23, 14159 Antežeriai, Vilniaus r., LT Markas SŪDŽIUS, Saulėtekio al. 35-52, 10222 Vilnius, LT

Attorney or representative
(74)

Title
(54)	HOLOGRAPIHIC DEVICE AND METHOD FOR DETERMINATION OF PHOTOELECTRIC PARAMETERS OF A SEMICONDUCTOR

Last renewal fee
	Payment date	Validity (years)	Amount
	2009-02-24	5	400.00 LTL

Legal status
	Patent lapsed (non-payment of fees)
	Invalidation date	2010-03-01