Patent details

EN | LT

LT - Plazmos tankio matavimo metodas ir sistema, naudojant plačiajuosčius terahercų dažnio elektromagnetinius impulsus

EN - METHOD AND SYSTEM FOR MEASURING PLASMA DENSITY USING BROADBAND TERAHERTZ ELECTROMAGNETIC PULSES

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Patent in force

Claims | Abstract | Licences/Sublicenses

Bibliographic data

Indications of the International Patent Classification (IPC)
(51)	INT.CL.: (2023.01)	G01W 1/00 B01D 59/44 H01S 5/00

Patent
(11)	Number of the document	7016
(13)	Kind of document	B
(21)	Application number	2021 568
(22)	Date of filing the application	2021-10-28
(41)	Date of publication of the application	2023-05-10
(45)	Date of publication of patent	2023-08-10

Applicant
(71)	Vilniaus universitetas, Universiteto g. 3, LT-01513 Vilnius, LT

Inventors
(72)	Virgilijus VAIČAITIS, LT Ona BALACHNINAITĖ, LT Aidas MATIJOŠIUS, LT

Grantee
(73)	Vilniaus universitetas, Universiteto g. 3, LT-01513 Vilnius, LT

Attorney or representative
(74)	Otilija KLIMAITIENĖ, AAA Law, A. Goštauto g. 40B, Verslo centras "Dvyniai", LT-03163 Vilnius, LT

Title
(54)	METHOD AND SYSTEM FOR MEASURING PLASMA DENSITY USING BROADBAND TERAHERTZ ELECTROMAGNETIC PULSES

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	Payment date	Validity (years)	Amount
	2025-10-23	5	115.00 EUR

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	2026-10-28